JPH0568545B2 - - Google Patents
Info
- Publication number
- JPH0568545B2 JPH0568545B2 JP59079231A JP7923184A JPH0568545B2 JP H0568545 B2 JPH0568545 B2 JP H0568545B2 JP 59079231 A JP59079231 A JP 59079231A JP 7923184 A JP7923184 A JP 7923184A JP H0568545 B2 JPH0568545 B2 JP H0568545B2
- Authority
- JP
- Japan
- Prior art keywords
- plasma generation
- metal
- containing substance
- ions
- thin film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 150000002500 ions Chemical class 0.000 claims description 28
- 239000002184 metal Substances 0.000 claims description 20
- 229910052751 metal Inorganic materials 0.000 claims description 20
- 238000001704 evaporation Methods 0.000 claims description 18
- 239000000126 substance Substances 0.000 claims description 18
- 230000008020 evaporation Effects 0.000 claims description 16
- 239000000758 substrate Substances 0.000 claims description 16
- 239000010409 thin film Substances 0.000 claims description 14
- 238000010884 ion-beam technique Methods 0.000 claims description 3
- 239000007789 gas Substances 0.000 description 9
- 238000000034 method Methods 0.000 description 5
- 238000000605 extraction Methods 0.000 description 4
- 238000010894 electron beam technology Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000001133 acceleration Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005265 energy consumption Methods 0.000 description 2
- 150000002736 metal compounds Chemical class 0.000 description 2
- 238000007738 vacuum evaporation Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 150000001639 boron compounds Chemical class 0.000 description 1
- 150000001722 carbon compounds Chemical class 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 229910017464 nitrogen compound Inorganic materials 0.000 description 1
- 150000002830 nitrogen compounds Chemical class 0.000 description 1
- 150000003377 silicon compounds Chemical class 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/221—Ion beam deposition
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59079231A JPS60221566A (ja) | 1984-04-18 | 1984-04-18 | 薄膜形成装置 |
US06/724,188 US4657774A (en) | 1984-04-18 | 1985-04-17 | Method for thin film formation |
US06/822,814 US4676194A (en) | 1984-04-18 | 1986-01-27 | Apparatus for thin film formation |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59079231A JPS60221566A (ja) | 1984-04-18 | 1984-04-18 | 薄膜形成装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6780485A Division JPS60223113A (ja) | 1985-03-30 | 1985-03-30 | 薄膜形成方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60221566A JPS60221566A (ja) | 1985-11-06 |
JPH0568545B2 true JPH0568545B2 (en]) | 1993-09-29 |
Family
ID=13684105
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59079231A Granted JPS60221566A (ja) | 1984-04-18 | 1984-04-18 | 薄膜形成装置 |
Country Status (2)
Country | Link |
---|---|
US (2) | US4657774A (en]) |
JP (1) | JPS60221566A (en]) |
Families Citing this family (58)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4782267A (en) * | 1986-02-07 | 1988-11-01 | Applied Electron Corporation | In-situ wide area vacuum ultraviolet lamp |
US5135607A (en) * | 1986-04-11 | 1992-08-04 | Canon Kabushiki Kaisha | Process for forming deposited film |
KR900005118B1 (ko) * | 1986-07-14 | 1990-07-19 | 미쓰비시전기주식회사 | 박막 형성장치 |
US4800840A (en) * | 1986-09-24 | 1989-01-31 | Rockwell International Corporation | Method and apparatus for vapor stream discrimination |
US4882198A (en) * | 1986-11-26 | 1989-11-21 | Optical Coating Laboratory, Inc. | System and method for vacuum deposition of thin films |
JPS63215578A (ja) * | 1987-02-28 | 1988-09-08 | 株式会社豊田中央研究所 | セラミツク材料表面への固体潤滑被膜の形成方法 |
US4876984A (en) * | 1987-06-12 | 1989-10-31 | Ricoh Company, Ltd. | Apparatus for forming a thin film |
US4816291A (en) * | 1987-08-19 | 1989-03-28 | The Regents Of The University Of California | Process for making diamond, doped diamond, diamond-cubic boron nitride composite films |
DE3839903A1 (de) * | 1987-11-25 | 1989-06-08 | Mitsubishi Electric Corp | Verfahren und vorrichtung zum aufdampfen von duennschichten |
US4902572A (en) * | 1988-04-19 | 1990-02-20 | The Boeing Company | Film deposition system |
US4883686A (en) * | 1988-05-26 | 1989-11-28 | Energy Conversion Devices, Inc. | Method for the high rate plasma deposition of high quality material |
US5133849A (en) * | 1988-12-12 | 1992-07-28 | Ricoh Company, Ltd. | Thin film forming apparatus |
US4951604A (en) * | 1989-02-17 | 1990-08-28 | Optical Coating Laboratory, Inc. | System and method for vacuum deposition of thin films |
JPH03111578A (ja) * | 1989-06-29 | 1991-05-13 | Toshiba Corp | 薄膜形成方法及び薄膜形成装置 |
DE3931565C1 (en]) * | 1989-09-22 | 1991-01-24 | Dornier Luftfahrt Gmbh, 8000 Muenchen, De | |
US5114559A (en) * | 1989-09-26 | 1992-05-19 | Ricoh Company, Ltd. | Thin film deposition system |
JP2786283B2 (ja) * | 1989-12-22 | 1998-08-13 | 株式会社日立製作所 | 表面改質方法およびその装置並びに表面改質基材 |
DE4126851A1 (de) * | 1991-08-14 | 1993-02-18 | Krupp Widia Gmbh | Werkzeug mit verschleissfester schneide aus kubischem bornitrid oder polykristallinem kubischem bornitrid, verfahren zu dessen herstellung sowie dessen verwendung |
DE4128547A1 (de) * | 1991-08-28 | 1993-03-04 | Leybold Ag | Verfahren und vorrichtung fuer die herstellung einer entspiegelungsschicht auf linsen |
DE4204650C1 (en]) * | 1992-02-15 | 1993-07-08 | Hoffmeister, Helmut, Dr., 4400 Muenster, De | |
US6475333B1 (en) * | 1993-07-26 | 2002-11-05 | Nihon Shinku Gijutsu Kabushiki Kaisha | Discharge plasma processing device |
US5628829A (en) * | 1994-06-03 | 1997-05-13 | Materials Research Corporation | Method and apparatus for low temperature deposition of CVD and PECVD films |
US5665640A (en) * | 1994-06-03 | 1997-09-09 | Sony Corporation | Method for producing titanium-containing thin films by low temperature plasma-enhanced chemical vapor deposition using a rotating susceptor reactor |
WO1995034092A1 (en) * | 1994-06-03 | 1995-12-14 | Materials Research Corporation | A method of nitridization of titanium thin films |
US5975912A (en) * | 1994-06-03 | 1999-11-02 | Materials Research Corporation | Low temperature plasma-enhanced formation of integrated circuits |
US5518780A (en) * | 1994-06-16 | 1996-05-21 | Ford Motor Company | Method of making hard, transparent amorphous hydrogenated boron nitride films |
JPH09112448A (ja) * | 1995-10-18 | 1997-05-02 | Matsushita Electric Ind Co Ltd | スクロール圧縮機 |
US6827824B1 (en) | 1996-04-12 | 2004-12-07 | Micron Technology, Inc. | Enhanced collimated deposition |
US5885666A (en) * | 1997-05-06 | 1999-03-23 | General Motors Corporation | Conversion of hexagonal-like BN to cubic-like BN by ion implantation |
JP3599564B2 (ja) | 1998-06-25 | 2004-12-08 | 東京エレクトロン株式会社 | イオン流形成方法及び装置 |
US6200649B1 (en) * | 1999-07-21 | 2001-03-13 | Southwest Research Institute | Method of making titanium boronitride coatings using ion beam assisted deposition |
US20050208218A1 (en) * | 1999-08-21 | 2005-09-22 | Ibadex Llc. | Method for depositing boron-rich coatings |
US6452338B1 (en) | 1999-12-13 | 2002-09-17 | Semequip, Inc. | Electron beam ion source with integral low-temperature vaporizer |
JP4504511B2 (ja) | 2000-05-26 | 2010-07-14 | 忠弘 大見 | プラズマ処理装置 |
JP4621333B2 (ja) * | 2000-06-01 | 2011-01-26 | ホーチキ株式会社 | 薄膜形成方法 |
TW521386B (en) * | 2000-06-28 | 2003-02-21 | Mitsubishi Heavy Ind Ltd | Hexagonal boron nitride film with low dielectric constant, layer dielectric film and method of production thereof, and plasma CVD apparatus |
US6596399B2 (en) | 2000-12-04 | 2003-07-22 | Guardian Industries Corp. | UV absorbing/reflecting silver oxide layer, and method of making same |
JP4078084B2 (ja) * | 2002-01-28 | 2008-04-23 | キヤノン株式会社 | イオン化成膜方法及び装置 |
KR100476370B1 (ko) * | 2002-07-19 | 2005-03-16 | 주식회사 하이닉스반도체 | 배치형 원자층증착장치 및 그의 인시튜 세정 방법 |
US7421973B2 (en) * | 2003-11-06 | 2008-09-09 | Axcelis Technologies, Inc. | System and method for performing SIMOX implants using an ion shower |
TWI603916B (zh) | 2005-08-30 | 2017-11-01 | 恩特葛瑞斯股份有限公司 | 利用選擇性氟化硼前驅物之硼離子植入方法,及供植入用 之大群氫化硼之形成方法 |
US20100112795A1 (en) * | 2005-08-30 | 2010-05-06 | Advanced Technology Materials, Inc. | Method of forming ultra-shallow junctions for semiconductor devices |
EP1947210A1 (fr) * | 2007-01-16 | 2008-07-23 | ARCELOR France | Procede de revetement d'un substrat, installation de mise en oeuvre du procede et dispositif d'alimentation en metal d'une telle installation |
US20110021011A1 (en) | 2009-07-23 | 2011-01-27 | Advanced Technology Materials, Inc. | Carbon materials for carbon implantation |
TW201110831A (en) * | 2009-09-03 | 2011-03-16 | Chunghwa Picture Tubes Ltd | Plasma apparatus and method of fabricating nano-crystalline silicon thin film |
US8062965B2 (en) * | 2009-10-27 | 2011-11-22 | Advanced Technology Materials, Inc. | Isotopically-enriched boron-containing compounds, and methods of making and using same |
US8598022B2 (en) | 2009-10-27 | 2013-12-03 | Advanced Technology Materials, Inc. | Isotopically-enriched boron-containing compounds, and methods of making and using same |
US8138071B2 (en) * | 2009-10-27 | 2012-03-20 | Advanced Technology Materials, Inc. | Isotopically-enriched boron-containing compounds, and methods of making and using same |
TWI466179B (zh) | 2010-02-26 | 2014-12-21 | Advanced Tech Materials | 用以增進離子植入系統中之離子源的壽命及性能之方法與設備 |
US8779383B2 (en) | 2010-02-26 | 2014-07-15 | Advanced Technology Materials, Inc. | Enriched silicon precursor compositions and apparatus and processes for utilizing same |
EP2612349A4 (en) | 2010-08-30 | 2016-09-14 | Entegris Inc | DEVICE AND METHOD FOR PRODUCING COMPOUNDS OR INTERMEDIATE PRODUCTS THEREOF FROM A SOLID MATERIAL AND USE OF SUCH CONNECTIONS AND INTERMEDIATE PRODUCTS |
US8828504B2 (en) * | 2010-12-17 | 2014-09-09 | International Business Machines Corporation | Deposition of hydrogenated thin film |
TWI583442B (zh) | 2011-10-10 | 2017-05-21 | 恩特葛瑞斯股份有限公司 | B2f4之製造程序 |
US20130098871A1 (en) | 2011-10-19 | 2013-04-25 | Fei Company | Internal Split Faraday Shield for an Inductively Coupled Plasma Source |
CN103122449B (zh) * | 2011-11-21 | 2017-02-15 | 管炜 | 离化装置及应用离化装置的镀膜装置 |
KR20200098716A (ko) | 2012-02-14 | 2020-08-20 | 엔테그리스, 아이엔씨. | 주입 빔 및 소스 수명 성능 개선을 위한 탄소 도판트 기체 및 동축류 |
US11062906B2 (en) | 2013-08-16 | 2021-07-13 | Entegris, Inc. | Silicon implantation in substrates and provision of silicon precursor compositions therefor |
US9287085B2 (en) * | 2014-05-12 | 2016-03-15 | Varian Semiconductor Equipment Associates, Inc. | Processing apparatus and method of treating a substrate |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5435920B2 (en]) * | 1974-06-10 | 1979-11-06 | ||
GB1483966A (en) * | 1974-10-23 | 1977-08-24 | Sharp Kk | Vapourized-metal cluster ion source and ionized-cluster beam deposition |
US4161418A (en) * | 1975-06-27 | 1979-07-17 | Futaba Denshi Kogyo K. K. | Ionized-cluster-beam deposition process for fabricating p-n junction semiconductor layers |
US4218495A (en) * | 1975-07-18 | 1980-08-19 | Futaba Denshi Kogyo K.K. | Schottky barrier type solid-state element |
AU531847B2 (en) * | 1979-02-23 | 1983-09-08 | Sekisui Kagaku Kogyo Kabushiki Kaisha | Magnetic recording medium + process for production thereof |
-
1984
- 1984-04-18 JP JP59079231A patent/JPS60221566A/ja active Granted
-
1985
- 1985-04-17 US US06/724,188 patent/US4657774A/en not_active Expired - Fee Related
-
1986
- 1986-01-27 US US06/822,814 patent/US4676194A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US4657774A (en) | 1987-04-14 |
JPS60221566A (ja) | 1985-11-06 |
US4676194A (en) | 1987-06-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |